High-speed systems rely on a great deal of analog content in order to process signals and data properly. Whether it is the very low voltage regulators powering a system or the various digital to analog converters (DACs) and analog to digital converters (ADCs), these systems require accurate and low noise tools for measurement and verification.

Introspect Technology products are used regularly in analog and mixed-signal paradigms. For example, Modem chipsets converting RF signals into digital (and vice versa) often rely on a mix of analog sections and SerDes sections. Similarly, low voltage power delivery network (PDN) design and optimization benefits from our various hardware probing and software processing solutions.

Industry Challenges

  • Mixed-signal analog and digital chains
  • System-level interaction between analog and digital
  • Very low voltage levels
  • Very low noise levels

Introspect Capability

  • SerDes tools for generating or receiving real-time data converter traffic
  • Low voltage probing solutions
  • Sophisticated software tools for mixed-domain time and frequency analysis
  • PurVue Analyzer™: Brand new I3C protocol-triggered real-time oscilloscope compatible with SV4E-I3C I3C Test and Debug Module, thus eliminating the need for external active probes or benchtop oscilloscopes.

Testers

SV7C Personalized SerDes Tester
SV7C Personalized SerDes Tester
All-in-one, phase-aligned bit error rate tester (BERT) and protocol exerciser and analyzer
SV4E I3C with I3C PurVue Analyzer
I3C PurVue Analyzer™
Embedded Real-Time Oscilloscope for SV4E-I3C
PV1 Active Probe
PV1 Universal Active Probe
Oscilloscope and protocol analyzer probing solution for multi-Gbps applications
SV4E-I3C
SV4E-I3C I3C Test and Debug Module
Complete multi-lane I3C protocol exerciser
SV3D-14 Direct Attach SerDes Test Module
Ultra-compact 32 lane test module for mounting on any application board (14.1 Gbps)
SV3D-12 Direct Attach SerDes Test Module
Ultra-compact 32 lane test module for mounting on any application board (12.5 Gbps)
SV3D-8 Direct Attach SerDes Test Module
Ultra-compact 32 lane test module for mounting on any application board (8 Gbps)
SV3D-4
Ultra-compact 32 lane test module for mounting on any application board (4 Gbps)
SV2D-32 Direct Attach SerDes Test Module
High-performance tester that mounts directly on any load board (32 Gbps)
SV1D-4
Highly integrated tester that mounts directly on an ATE load board (4 Gbps)
SV3C-4 Personalized SerDes Tester
Highly parallel tester for DDR, clock forwarded, and embedded clock applications up to 4 Gbps
SV2C
SV2C-32 Personalized SerDes Tester
8-Lane, 32 Gbps for high-end SerDes applications
SV1C-14 Personalized SerDes Tester
SerDes tester for clock forwarded and embedded clock applications up to 14.1 Gbps
SV1C-12 Personalized SerDes Tester
SerDes tester for clock forwarded and embedded clock applications up to 12.5 Gbps
SV1C-8 Personalized SerDes Tester
SerDes tester for applications up to 8 Gbps
SV1C-4 Personalized SerDes Tester
SerDes tester for applications up to 4 Gbps

Questions? Visit our FAQ page or contact us for any inquiries.