Modern data center, telecommunications, and signal processing systems rely on highly sophisticated clock and timer solutions. These solutions include programmable clock generators, clock fanout buffers, and delay elements. Since all of these elements ultimately define the jitter performance of high-speed signal chains, they require careful design and validation.

Introspect Technology’s C Series line of products are ideal for the characterization of PLLs within clock and timer circuits. They are also ideal for skew measurement and analysis, offering a cost-effective alternative to high-end tools such as oscilloscopes.

Industry Challenges

  • Large channel counts
  • Complex frequency combinations
  • Low-voltage differential signaling
  • Very low jitter levels

Introspect Capability

  • Up to 32 channels per tester
  • Any rate programming with ppm accuracy
  • Programmable voltage and timing levels
  • Sophisticated signal parameter (e.g. rise time, skew) measurement

Testers

SV1C-14
General purpose SerDes tester for clock forwarded and embedded clock applications up to 14.1 Gbps
SV1C-12
General purpose SerDes tester for clock forwarded and embedded clock applications up to 12.5 Gbps
SV1C-8
SerDes tester for applications up to 8 Gbps
SV1C-4
SerDes tester for applications up to 4 Gbps

Accessories

PV1 Active Probe
2.5 Gbps active probe

Questions? Visit our FAQ page or contact us for any inquiries.