Manufacturing Test

The semiconductor manufacturing process relies on automated test equipment (ATE) to ensure quality during the various stages of wafer fabrication and assembly. Despite the continuous transformation of the test industry in recent years, a growing number of challenges remain, and these mainly revolve around the need for at-speed testing even at the wafer level.

The Introspect Technology D Series addresses the challenge of performing at-speed testing on any wafer probe or final test station. With self-contained power, clocking, and control, the D Series not only satisfies your high-volume manufacturing (HVM) test needs for complex SerDes interfaces, but is also able to completely eliminate conventional, legacy ATE.