Industry Challenges
- At-speed functional test
- Multi-site test
- Concurrent, multi-protocol test
- Test vector processing and fail map analysis
Introspect Capability
- Up to 56 Gbps test pattern generation and analysis
- Up to 32 channels per test module
- Any rate programming, and per-channel analog controls
- Instrument-grade, calibrated timing and voltage controls
- Jitter injection and jitter measurement in production
SV3D-4
Ultra-compact 32 lane test module for mounting on any application board (4 Gbps)
SV1D-4
Highly integrated tester that mounts directly on an ATE load board (4 Gbps)