• Multi-site, fully parallel test capability with individual pattern and BER control per lane
  • Self-contained solution with on-board power sequencers and clock synthesizers
  • Automated with built-in scripting capability for test time minimization
  • Tiny footprint and minimal I/O requirements
Popular solutions
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BENEFITS

  • Multi-site, fully parallel test capability with individual pattern and BER control per lane
  • Self-contained solution with on-board power sequencers and clock synthesizers
  • Automated with built-in scripting capability for test time minimization
  • Tiny footprint and minimal I/O requirements

Features

The SV1D-4 Direct Attach SerDes Test Module is a highly-integrated tester that mounts directly on an application or test board without requiring cables. It satisfies the growing need for parallel, multi-site Gbps testing methodologies at the lowest possible total cost.

The SV1D-4 provides continuous data rate selection up to 4 Gbps. It features 8 independent transmitters with signal impairments including sinusoidal and random jitter injection, TX de-emphasis and lane-to-lane UI and sub-UI skew injection. It features 8 independent receivers with per-channel equalization, true parallel bit-error-rate measurement and controls for rapid eye-margining measurement. Communication with ATE is handled seamlessly via an SPI bus and via an optional parallel interface for extended data transfers.

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