• Multi-site, fully parallel test capability with individual pattern and BER control per lane
  • Self-contained solution with on-board power sequencers and clock synthesizers
  • Automated with built-in scripting capability for test time minimization
  • Tiny footprint and minimal I/O requirements

BENEFITS

  • Multi-site, fully parallel test capability with individual pattern and BER control per lane
  • Self-contained solution with on-board power sequencers and clock synthesizers
  • Automated with built-in scripting capability for test time minimization
  • Tiny footprint and minimal I/O requirements

Features

The SV1D-4 Direct Attach SerDes Test Module is a highly-integrated tester that mounts directly on an application or test board without requiring cables. It satisfies the growing need for parallel, multi-site Gbps testing methodologies at the lowest possible total cost.

The SV1D-4 provides continuous data rate selection up to 4 Gbps. It features 8 independent transmitters with signal impairments including sinusoidal and random jitter injection, TX de-emphasis and lane-to-lane UI and sub-UI skew injection. It features 8 independent receivers with per-channel equalization, true parallel bit-error-rate measurement and controls for rapid eye-margining measurement. Communication with ATE is handled seamlessly via an SPI bus and via an optional parallel interface for extended data transfers.

Questions? Visit our FAQ page or contact us for any inquiries.