PCI Express (PCIe) is a highly successful SerDes interface that is used in computing devices spanning a wide range of applications. Currently in its fourth generation with on-going roadmap development for a fifth generation, the PCIe interface is undergoing major technical advancements that require state-of-the-art development and validation tools. For example, Gen4 PCIe devices operate at 16 Gbps per lane and are expected to deliver very low bit error rate (BER) levels even over constrained and lossy transmission channels (e.g. printed circuit boards). This requirement has resulted in the implementation of complex equalization and adaptation algorithms that push the limits of analog signal processing, digital signal processing, and protocol-level data processing.

Although the design verification and electrical characterization of PCIe links may appear daunting, Introspect Technology has created tools to assist you with these very tasks. Our tools are highly parallel, allowing for the simultaneous, realistic analysis of real devices under test; and they are highly versatile, offering the capability for training sequence generation and equalization tuning.

Industry Challenges

  • Extremely high data rates
  • Large channel counts
  • Closed-eye receiver jitter tolerance testing
  • Stringent transmitter eye testing
  • Complex channel topologies
  • Complex link equalization training algorithms

Introspect Capability

  • Up to 32 Gbps coverage for Gen5 development
  • Up to 32 lanes per tester
  • Integrated per lane jitter injection and voltage noise injection
  • Integrated, per lane hardware-based clock and data recovery (CDR)
  • Integrated, per lane de-emphasis generation
  • Flexible pattern generation and training state machines

DDR & GDDR Exercisers

Product photo of SV7C
SV7C Personalized SerDes Tester
All-in-one, phase-aligned bit error rate tester (BERT) and protocol exerciser and analyzer

Serial & Parallel BERTs

SV3C-14 Personalized SerDes Tester
Highly parallel tester for DDR, clock forwarded, & embedded clock applications up to 14.1 Gbps
SV3C-12 Personalized SerDes Tester
Highly parallel tester for DDR, clock forwarded, and embedded clock applications up to 12.5 Gbps
SV3C-8 Personalized SerDes Tester
Highly parallel tester for DDR, clock forwarded, and embedded clock applications up to 8 Gbps
SV3C-4 Personalized SerDes Tester
Highly parallel tester for DDR, clock forwarded, and embedded clock applications up to 4 Gbps
SV1C-14 Personalized SerDes Tester
SerDes tester for clock forwarded and embedded clock applications up to 14.1 Gbps
SV1C-12 Personalized SerDes Tester
SerDes tester for clock forwarded and embedded clock applications up to 12.5 Gbps
SV1C-8 Personalized SerDes Tester
SerDes tester for applications up to 8 Gbps
SV1C-4 Personalized SerDes Tester
SerDes tester for applications up to 4 Gbps

Probe Products

Remote Sampling Head product photo
RSH2 Remote Sampling Head
12 Active Probes Integrated Into a Clean, Shielded Form Factor
RSH1 Remote Sampling Head
Clean Probing of Parallel Buses
PV2 Universal Active Probe
Probing Solution with 8 GHz Bandwidth
PV1 Active Probe
PV1 Universal Active Probe
Probing Solution with 5 GHz Bandwidth

Test Modules

SV3D-14 Direct Attach SerDes Test Module
Ultra-compact 32 lane test module for mounting on any application board (14.1 Gbps)
SV3D-12 Direct Attach SerDes Test Module
Ultra-compact 32 lane test module for mounting on any application board (12.5 Gbps)
SV3D-8 Direct Attach SerDes Test Module
Ultra-compact 32 lane test module for mounting on any application board (8 Gbps)
SV3D-4
Ultra-compact 32 lane test module for mounting on any application board (4 Gbps)
SV1D-14 Direct Attach SerDes Test Module
Mounts directly on an ATE load board (14 Gbps)
SV1D-12 Direct Attach SerDes Test Module
Highly integrated tester that mounts directly on an ATE load board (12.5 Gbps)
SV1D-4
Highly integrated tester that mounts directly on an ATE load board (4 Gbps)

Questions? Visit our FAQ page or contact us for any inquiries.