Representing the fastest growing segment of the semiconductor industry, memory technology continues to rapidly improve on density, efficiency, and transfer rates. When it comes to building the latest generation double-data-rate (DDR) memory interfaces, developers face unprecedented challenges during both the design verification and interface characterization phases. On one hand, DDR interfaces are single-ended and require a great deal of signal traces for a single memory device; and on the other hand, the latest standards such as DDR4 and DDR5 require extremely accurate measurement setups and include receiver stress requirements.

Introspect Technology’s highly parallel pattern generator and signal analyzer solutions are ideal for DDR4 and DDR5 interface tests. Our solutions contain a wide host of protocol features and physical layer features that are particularly tuned for DDR applications. What’s more, all of these features are offered at extremely competitive prices for CPU makers, interface makers, DRAM makers, and system integrators.

Industry Challenges

  • High data rates
  • Large channel counts
  • Tight skew requirements
  • Single-ended
  • Deterministic pattern timings

Introspect Capability

  • Up to 12.5 Gbps in the DDR relevant testers
  • Up to 112 channels in a configured setup
  • Deterministic, high-precision skew control
  • Pattern timeline technology
  • PurVue Analyzer™: Brand new I3C protocol-triggered real-time oscilloscope compatible with SV4E-I3C I3C Test and Debug Module, thus eliminating the need for external active probes or benchtop oscilloscopes.

Testers

SV7M-LPDDR5PA LPDDR5 Protocol Analyzer
High-Performance Debug, Compliance Validation, and Analysis
SV7C Personalized SerDes Tester
SV7C Personalized SerDes Tester
All-in-one, phase-aligned bit error rate tester (BERT) and protocol exerciser and analyzer
SV4E I3C with I3C PurVue Analyzer
PurVue Analyzer™
Embedded Real-Time Oscilloscope for SV4E-I3C
PV2 Universal Active Probe
Probing Solution with 8 GHz Bandwidth
PV1 Active Probe
PV1 Universal Active Probe
Oscilloscope and protocol analyzer probing solution for multi-Gbps applications
SV5C
SV5C-12 Parallel Bit Error Rate Tester (BERT)
Highly parallel tester for applications up to 12.5 Gbps
SV5D
SV5D-12 Direct Attach SerDes Test Module
High-performance tester that mounts directly on any load board (12.5 Gbps)
SV3C-8 Personalized SerDes Tester
Highly parallel tester for DDR, clock forwarded, and embedded clock applications up to 8 Gbps

Software Solutions

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DDR5 Test Suite
High-Performance Debug, Compliance Validation, and Analysis
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DDR5 RCD Sidebandbus
High-Performance Debug, Compliance Validation, and Analysis

Questions? Visit our FAQ page or contact us for any inquiries.