• Fastest time to market: perform deep memory read/write operations and characterize electrical and timing specifications
  • Most capable PAM3 signaling: leveraging years of expertise in SerDes technology, the PAM3 pin-electronics exceed the requirements of the GDDR7 specifications
  • Automated: scripting capability ideal for debug tasks, verification, and full‐fledged production screening of devices and system boards
Max NRZ Data Rate

20 Gbps

Number of Channels

72

Max PAM3 Data Rate

40 Gbps

Benefits

  • Fastest time to market: perform deep memory read/write operations and characterize electrical and timing specifications
  • Most capable PAM3 signaling: leveraging years of expertise in SerDes technology, the PAM3 pin-electronics exceed the requirements of the GDDR7 specifications
  • Automated: scripting capability ideal for debug tasks, verification, and full‐fledged production screening of devices and system boards

Features

The M5512 GDDR7 Memory Test System is a category-creating solution for characterizing and functionally testing memory integrated circuits based on the JEDEC Graphics Double Data Rate 7 SGRAM Standard (GDDR7). Featuring high-speed, bidirectional PAM3 signaling, low-speed NRZ signaling, and complete protocol training capability, this solution is the optimal tool to help bring next-generation graphics memory to the industry.

Access to Every Pin and Every Memory Cell

 

Virtual Memory Controller

The M5512 is powered by the versatile Pinetree software environment. Combining this category-creating solution with our software allows you to bring up any GDDR7 memory devices, debug protocol errors, and much more. Focus on your test algorithms and let the M5512 virtual memory controller manage the protocol.

 

 

Questions? Visit our FAQ page or contact us for any inquiries.