Representing the fastest growing segment of the semiconductor industry, memory technology continues to rapidly improve on density, efficiency, and transfer rates. When it comes to building the latest generation double-data-rate (DDR) memory interfaces, developers face unprecedented challenges during both the design verification and interface characterization phases. On one hand, DDR interfaces are single-ended and require a great deal of signal traces for a single memory device; and on the other hand, the latest standards such as DDR4 and DDR5 require extremely accurate measurement setups and include receiver stress requirements.

Introspect Technology’s highly parallel pattern generator and signal analyzer solutions are ideal for DDR4 and DDR5 interface tests. Our solutions contain a wide host of protocol features and physical layer features that are particularly tuned for DDR applications. What’s more, all of these features are offered at extremely competitive prices for CPU makers, interface makers, DRAM makers, and system integrators.

Industry Challenges

  • High data rates
  • Large channel counts
  • Tight skew requirements
  • Single-ended
  • Deterministic pattern timings

Introspect Capability

  • Up to 12.5 Gbps in the DDR relevant testers
  • Up to 112 channels in a configured setup
  • Deterministic, high-precision skew control
  • Pattern timeline technology

Testers

SV5C
SV5C-12
Highly parallel tester for applications up to 12.5 Gbps
SV5D
SV5D-12
High-performance tester that mounts directly on any load board (12.5 Gbps)
SV3C-8
Highly parallel tester for DDR, clock forwarded, and embedded clock applications up to 8 Gbps

Accessories

PV1 Active Probe
PV1 Active Probe
Universal active probe

Questions? Visit our FAQ page or contact us for any inquiries.