DDR & GDDR Exercisers

All-in-one, phase-aligned bit error rate tester (BERT) and protocol exerciser and analyzer
Serial & Parallel BERTs

Highly parallel tester for DDR, clock forwarded, & embedded clock applications up to 14.1 Gbps

Highly parallel tester for DDR, clock forwarded, and embedded clock applications up to 12.5 Gbps

Highly parallel tester for DDR, clock forwarded, and embedded clock applications up to 8 Gbps

Highly parallel tester for DDR, clock forwarded, and embedded clock applications up to 4 Gbps

SerDes tester for clock forwarded and embedded clock applications up to 14.1 Gbps

SerDes tester for clock forwarded and embedded clock applications up to 12.5 Gbps

SerDes tester for applications up to 8 Gbps

SerDes tester for applications up to 4 Gbps
Probe Products

Probing Solution with 5 GHz Bandwidth
Test Modules

Ultra-compact 32 lane test module for mounting on any application board (14.1 Gbps)

Ultra-compact 32 lane test module for mounting on any application board (12.5 Gbps)

Ultra-compact 32 lane test module for mounting on any application board (8 Gbps)

Ultra-compact 32 lane test module for mounting on any application board (4 Gbps)

Mounts directly on an ATE load board (14 Gbps)

Highly integrated tester that mounts directly on an ATE load board (12.5 Gbps)

Highly integrated tester that mounts directly on an ATE load board (4 Gbps)
Questions? Visit our FAQ page or contact us for any inquiries.