The M Series introduces a new class of massively parallel high-speed testers that are ideal for functional validation, high-volume data collection and characterization. These systems provide bench-grade measurement accuracy and precision, but at a scale that is not possible using conventional bit error rate tester (BERT) solutions. At the same time, they are programmed and operated like automatic test equipment (ATE), enabling full functional, at-speed testing. These systems do not need special cooling and can be located on a user’s local bench instead of a specialized ATE lab, hence the name ATE-on-Bench.

 

Ideal for

  • Functional testing of LPDDR, DDR, GDDR, and HBM memory devices
  • High-volume design validation and characterization
  • Test stand automation including device power supplies, handlers, and thermal control units

Key Features at a Glance

  • Up to 192 pattern generators and 192 error detectors per tester
  • Industry-leading vector testing capability
  • Advanced, per-pin waveform shaping technology
  • Complete suite of characterization features including jitter injection, jitter measurement, equalization control and analysis, source-synchronous sampling, stressed-eye generation, and bit error rate testing
  • Device manipulator and handler control within an integrated software environment

Memory Test Systems

Image of GDDR7 Memory Test System
M5512 GDDR7 Memory Test System
Award-winning ATE-on-Bench for GDDR7 Characterization and Test

Protocol Analyzers

Product photo of the LPDDR5PA
SV7M-LPDDR5PA LPDDR5 Protocol Analyzer
High-Performance Debug, Compliance Validation, and Analysis

Questions? Visit our FAQ page or contact us for any inquiries.