Title: System Oriented Testing for Memory Interfaces
Date: Tuesday, October 20, 2020
Time: 13:30 – 14:00 Eastern Time
EDI CON ONLINE is a free online conference that takes place on every Tuesday during the month of October. Designed to provide the latest technical training and information to engineers attending remotely (online) from the comfort of their desks and laboratory benches, this conference covers topics in RF, Microwave, Signal Integrity, and much more.
Introspect Technology’s Senior Member of Technical Staff, Ms. Erin Holley, will feature as a speaker on Tuesday October 20, 2020 at 1:30-2:00 PM Eastern Time. Ms. Holley’s presentation will cover the topic of testing highly parallel signaling interfaces such as those found in server memories.
Next-generation data center and server architectures rely heavily on high-speed signaling interfaces. No longer restricted to the networking sub-systems of the data center, these high-speed interfaces are used to connect processors, AI hardware accelerators, switching and routing fabrics, and of course extremely high-density memory channels. Testing these highly parallel signaling interfaces represents a particular challenge due to the tight interaction between environmental parameters, physical layer effects, and protocol payloads. Memory test solutions in particular must be capable of adapting to protocol changes and in-depth compliance measurements, as well as providing a means to perform system-level functional validation. This workshop will include an overview and demo of Introspect’s highly parallel memory interface test solution, showing the role it plays in ensuring the proper characterization and screening of DIMMs and components for the DDR5, and similar, memory standards.
Register for free today at this link.