Minimized Loading: Especially useful for low-voltage applications such as MIPI or Embedded DisplayPort

Low Noise: enables high-reliability protocol analysis or bit error rate testing

Multiple Connection Modes: permanent or temporary attachment to DUTs

 

 

 

Benefits

Minimized Loading: Especially useful for low-voltage applications such as MIPI or Embedded DisplayPort

Low Noise: enables high-reliability protocol analysis or bit error rate testing

Multiple Connection Modes: permanent or temporary attachment to DUTs

 

 

 

Features

Active Probing Solution: high input impedance and active signal amplification

Shielded From EMI Issues: all active components are shielded from external electromagnetic signals

Standard 50 Ohm Co-Axial Output Interface: compatible with any 50 Ohm instrument

Introspect’s multi-conductor MIPI probe solution provides a simple connectorized interface for easy attachment to parallel high-speed buses. Whereas multiple probes often result in a messy and overwhelming workspace, or whereas signals are in hard-to-reach areas, the SV5C Remote Sampling Head enables a super clean signal probing setup.

 

 

Typical Application: Form Factor Probing of eDP-Based Designs

 

 

 

 

 

 

 

 

 

 

 

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