SV3D Direct Attach SerDes Transceiver Endpoint

32 Lane, 14 Gbps Plugin-Module Enables Test on Any Load Board

Highly‐integrated tester that mounts directly on an application or test board without requiring cables. Featuring 32 independent receivers and transmitters, SV3D satisfies a growing need for  parallel, multi-site Gbps testing methodology at the lowest possible total cost.

Key Features

  • Data rates and lanes: 250 Mbps to 14 Gbps fully-continuous operating range on up to 32 independent Tx and Rx differential lanes.
  • Signal impairments: sinusoidal and random jitter, de‐emphasis, skew, and bit  slip.
  • DUT Tx measurements: eye diagram, EQ, analog waveform and jitter separation.
  • Easy of integration: direct attachment with standard, low-cost connectors. Single 12-V DC power supply with internal regulation. Internal clock synthesis and jitter cleaning.

Key Benefits

  • Multi-Site: with its small size and high lane count, the SV3D can test many parallel devices simultaneously.
  • Self Contained: an all‐in‐one system reduces board space and helps create a compact tester-on-board for characterization tasks or production test.
  • Automation: scripting capability is ideal for debug tasks, verification and full‐fledged production screening of devices and system boards.

Pattern Generator Functions

Feature
Description
Benefit
Pattern Sources Pre-built patterns, PRBS (5, 7, 9, 11, 15, 23, 31), custom user-defined pattern, nested pattern sequencers Allows for flexible stimulus generation (e.g. training sequences or compliance patterns)
Analog Controls Polarity inversion, voltage swing, transmit pre-emphasis, duty cycle, bit-slip Provides deep receiver stress characterization with truly independent multi-variable analysis
Synthesis Capability Multi-source sinusoidal jitter injection, random jitter injection, de-emphasis generation Allows for compliance-based receiver testing with internally synthesized noise sources

BERT and Scope Functions

Feature
Description
Benefit
Error Detectors BERT engines work with all types of patterns listed under Pattern Generator section; single-shot (up to 2^32 cycles) or continuous error counting modes; 32-bit error counters; automatic pattern alignment Optimized architecture for production testing and data collection, ensuring rapid pattern alignment and error checking
Equalizer Control Per lane continuous-time linear equalizers (16 dB); ability to measure closed eyes Allows for design exploration, de-embedding, and correlation with simulation
Clock Recovery Per-pin analog, hardware clock recovery unit with optimized connection to sampling circuitry Offers a realistic test environment on any production ATE load board
Analysis Capability Identify pattern; BERT measurement; BERT scan; eye diagram; analog waveform capture; jitter separation; transition & non-transition eyes Rapid signal integrity analysis functions behind each transceiver channel

Environment and Control

Feature
Description
Benefit
Parallel Tester Bus Dedicated low-frequency control I/O pins for extended test program flexibility Access and set the DUT SerDes control registers or expand the SPI bus for multi-site testing
User Interface SPI command register space with full suite of capability. Compatible with Introspect ESP software for automatic SPI vector generation Enables full lab automation; provides a scalable, future-proof solution
Scripting Data logging; automatic report generation Suited for performing optimization sweeps