Direct Attach SerDes Transceiver Endpoint

SV1D Direct-Attach SerDes Transceiver Endpoint

Plug-In Module for High-Performance Testing on Any Load Board

Highly‐integrated tester that mounts directly on an application or test board without requiring cables. Featuring eight independent receivers and transmitters, SV1D satisfies a growing need for parallel, system‐oriented testing methodology that closely mimics the final application of the device under test.

Key Features

  • Data rates: 250 Mbps to 14 Gbps fully-continuous operating range.
  • Lanes: 8 Tx and 8 Rx, differential with per channel adjustment of voltage and timing.
  • Signal impairments: sinusoidal and random jitter, de‐emphasis, skew, and bit  slip.
  • DUT Tx measurements: eye diagram, EQ, analog waveform and jitter separation.
  • Easy of integration: direct attachment with standard, low-cost connectors. Single 12-V DC power supply with internal regulation.

Key Benefits

  • Parallel: with increasing crosstalk issues, a truly parallel system allows for the most comprehensive “stress test” that is possible. SV1 C tests all your lanes simultaneously.
  • Self Contained: an all‐in‐one system reduces board space and helps create a compact tester-on-board for characterization tasks or production test.
  • Automation: Scripting capability is ideal for debug tasks, verification and full‐fledged production screening of devices and system boards

Pattern Generator Functions

Feature
Description
Benefit
Pattern SourcesPre-built patterns, PRBS (5, 7, 9, 11, 15, 23, 31), custom user-defined pattern, nested pattern sequencersAllows for flexible stimulus generation (e.g. training sequences or compliance patterns)
Analog ControlsPolarity inversion, voltage swing, transmit pre-emphasis, duty cycle, bit-slipProvides deep receiver stress characterization with truly independent multi-variable analysis
Synthesis CapabilitySinusoidal jitter injection, random jitter injection, de-emphasis generationAllows for compliance-based receiver testing with internally synthesized noise sources

BERT and Scope Functions

Feature
Description
Benefit
Error DetectorsBERT engines work with all types of patterns listed under Pattern Generator section; single-shot (up to 2^32 cycles) or continuous error counting modes; 32-bit error counters; automatic pattern alignmentOptimized architecture for production testing and data collection, ensuring rapid pattern alignment and error checking
Equalizer ControlContinuous-time linear equalizers (16 dB); ability to measure closed eyesAllows for design exploration, de-embedding, and correlation with simulation
Clock RecoveryPer-pin analog, hardware clock recovery unit with optimized connection to sampling circuitryOffers a realistic test environment on any production ATE load board
Analysis CapabilityIdentify pattern; BERT measurement; BERT scan; eye diagram; analog waveform capture; jitter separation; transition & non-transition eyesRapid signal integrity analysis functions behind each transceiver channel

Environment and Control

Feature
Description
Benefit
DUT Control InterfaceSPI, JTAG, I2C control portsAccess and set the DUT SerDes control registers via the DUT JTAG Controller Port
User InterfaceSPI command register space with full suite of capability. Compatible with Introspect ESP software for automatic SPI vector generationEnables full lab automation; provides a scalable, future-proof solution
ScriptingData logging; automatic report generationSuited for performing optimization sweeps